大学物理 ›› 2018, Vol. 37 ›› Issue (4): 41-46.doi: 10.16854 /j.cnki.1000-0712.170099

• 物理实验 • 上一篇    下一篇

光学元件偏振参数的测量方法及装置

刘明强   

  1. 1.西南科技大学理学院,四川绵阳621010; 2. 中国科学院光电技术研究所,四川成都610209
  • 收稿日期:2017-03-03 修回日期:2017-08-29 出版日期:2018-04-21 发布日期:2018-04-21
  • 作者简介:刘明强( 1983—) ,男,四川宜宾人,西南科技大学理学院讲师,博士,主要从事光学检测、光热显微、微流控及微纳空间光热控制技 术与应用等方面研究.
  • 基金资助:
    国家自然科学基金( 11604274) 和西南科技大学博士研究基金( 15zx7136) 资助

Method and setup for determining the polarization parameters of optical elements

LIU Ming-qiang1,2   

  1. 1. School of Science,Southwest University of Science and Technology,Mianyang,Sichuan 621010,China; 2.Institute of Optics and Electronics,Chinese Academy of Sciences,Chengdu,Sichuan 610209,China
  • Received:2017-03-03 Revised:2017-08-29 Online:2018-04-21 Published:2018-04-21

摘要: 基于偏振光理论,对线偏振光经光学系统单个或多个元件反射后的偏振变化进行了理论分析: 分析表明,通过适当 调整反射光s、p 分量的振幅系数rs、rp 的值,可使经多个元件后偏振光的偏振度损失小于单个元件; 同时给出了准确确定光束 入射面的方法.在一简易装置上,测得780 nm 高反的两反射镜( 介质膜和银膜) 在偏振角和入射角均为45°时其偏振保偏比分 别为1 000 ∶ 1 和40 000 ∶ 1,且确定了两镜的振幅系数比( rp /rs) 和相位差δ,结果和椭偏仪一致.该方法及装置,一方面可为大 学物理中偏振相关的实验提供理论和实验指导,另一方面可用于科研或工程实际中在线准确测量光学元件或系统的偏振参数( rp /rs ,δ及偏振保偏比) .

关键词: 偏振参数测量, 振幅反射系数比, 相位差, 偏振保偏比, 光学元件

Abstract: Based on the polarized light theory,the polarization change of a linearly polarized light after   reflected from one or more optical elements is investigated theoretically. It is found that through appropriately setting   the amplitude reflection coefficients ( rs   ,rp   ) of optical elements,the polarization deterioration of the polarized light   induced by several optical elements can be lower than that induced by one element. A method for determining the   incidence plane of a light ray is given. In the experimental setup,the polarization maintaining ratios of two 780 nm high-reflection mirrors ( with dielectric and metallic coatings,respectively) at 45o( for both polarization angle and incidence angle) are determined to be 1 000 ∶ 1 and 40 000 ∶ 1,respectively. The amplitude coefficient ratio rp /rs and phase difference δ are in good agreement with those measured by the ellipsometry. This method and setup can, on the one hand,provide theoretical and experimental guidance for polarization-related physics experiments,and on the other hand,can be applied in scientific research and engineering fields for in-situ measurement of the reflection parameters ( rp /rs and δ) and polarization maintaining ratio of optical elements.

Key words: polarization maintaining ratio, optical mirrors, measurement setup, high detection sensitivity