大学物理 ›› 2018, Vol. 37 ›› Issue (4): 16-22.doi: 10.16854 /j.cnki.1000-0712.170215

• 教学讨论 • 上一篇    下一篇

一维任意电荷浓度分布引起的电势

茹国平   

  1. 复旦大学微电子学院,上海200433
  • 收稿日期:2017-04-21 修回日期:2017-10-02 出版日期:2018-04-21 发布日期:2018-04-21
  • 作者简介:茹国平( 1968—) ,男,浙江绍兴人,复旦大学微电子学院教授,博士,从事半导体物理与器件的教学和

Potential induced by one-dimensional arbitrary charge distribution

RU Guo-ping   

  1. School of Microelectronics,Fudan University,Shanghai 200433,China
  • Received:2017-04-21 Revised:2017-10-02 Online:2018-04-21 Published:2018-04-21

摘要: 以氧化层电荷非均匀分布的MOS 结构为例,介绍求解一维任意电荷浓度分布电势的3 种方法--电势叠加法、积 分区间变换法和掺杂矩法,并讨论它们的等价性.重点介绍了掺杂矩法在非均匀掺杂n+ p 结C-V 测试、非均匀掺杂MOSFET 阈值电压计算中的应用,并讨论了变容管、MOSFET 倒掺杂等原理.

关键词: 掺杂矩, 电势, 电容-电压, 阈值电压

Abstract: Three methods such as potential superposition,integration interval transformation and doping moment,are introduced to calculate the potential induced by one-dimensional arbitrary charge distribution,taking a MOS structure with non-uniformly distributed oxide charges as an example. The equivalence of the three methods is verified. As a focus,the doping moment method is employed in C-V characterization of a non-uniformly doped n+p junction and threshold voltage calculation of MOSFETs with a non-uniformly doped channel. The principles of varactors and retrograde doping in MOSFET are discussed.

Key words: doping moment, potential, capacitance-voltage, threshold voltage