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电子束电偏转实验中亮斑的线度研究

  • 陈杰 ,
  • 朱占武 ,
  • 张琴 ,
  • 刘国营 ,
  • 张西平 ,
  • 吴云沛
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  •  湖北汽车工业学院理学院,湖北十堰442002
陈杰( 1977—) ,男,湖北大悟人,湖北汽车工业学院理学院讲师,硕士,主要从事大学物理的教学研究

收稿日期: 2016-09-23

  修回日期: 2016-12-07

  网络出版日期: 2017-08-20

基金资助

校质量工程项目( JX201616) 、湖北省教育厅项目( 16Y105; B2016085) 资助

The length study of bright spots in the electric deflection of electron beam

  • CHEN Jie ,
  • ZHU Zhan-wu ,
  • ZHANG Qin ,
  • LIU Guo-ying ,
  • ZHANG Xi-ping ,
  • WU Yun-pei
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  •  School of Science,Hubei University of Automotive Technology,Shiyan,Hubei 442002,China

Received date: 2016-09-23

  Revised date: 2016-12-07

  Online published: 2017-08-20

摘要

从理论上研究了“电子束电偏转实验”中亮斑的形成原因及其线度的影响因素,推导出电子流偏转总量x、亮斑线度Δ 的表达式,并进行了数值模拟.研究结果表明,亮斑是由射入偏转电场的锥形电子束( 其锥角Δθ 实为一很小的量) 引起,而造成Δ 随加速电压U1、偏转电压Ux变化的原因是由于Δθ 关于偏转电场中心轴( z 轴) 的不对称分布.Δ 的大小还取决于Δθ 的大小.

本文引用格式

陈杰 , 朱占武 , 张琴 , 刘国营 , 张西平 , 吴云沛 . 电子束电偏转实验中亮斑的线度研究[J]. 大学物理, 2017 , 36(8) : 38 -40 . DOI: 10.16854 /j.cnki.1000-0712.2017.08.0011

Abstract

In the electric deflection of electron beam,the causes of bright spots and the factors of spots length are studied theoretically. The total expression x,of electron flow deflection and the length Δ,of bright spots are obtained and simulated numerically. The results show that bright spots are caused by the conical electron beam introduced into deflection field ( the angle Δθ,of conical electron beam is very small) ,and the reason of Δ varying with the change of accelerating voltage U1 ,deflection voltage Ux is Δθ asymmetry distribution on the central axis of deflection field. Also,Δ depends on the value of Δθ.
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