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用半导体微位移传感器测量磁致伸缩系数

  • 倪敏 ,
  • 张一帆 ,
  • 郑源明 ,
  • 董琳 ,
  • 赵彩安
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  • 1. 上海师范大学数理学院,上海200234;2. 复旦天欣科教仪器有限公司,上海200433
倪敏(1960— ),女,上海人,上海师范大学数理学院副教授,主要从事物理教育与物理实验研究工作.

收稿日期: 2016-12-16

  修回日期: 2017-01-23

  网络出版日期: 2017-09-20

基金资助

 

Measurement of magnetostrictive coefficient using micro - displacement sensor

  • NI Min1 ,
  • ZHANG Yi-fan1 ,
  • ZHEN Yuan-min2 ,
  • DONG Lin1 ,
  • ZHAO Cai-an1
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  • 1. Collage of Mathematics and Science,Shanghai Normal University,Shanghai 200234,China;   2. Fudan Days Hin Science Instrument CO. ,LTD,Shanghai 200433,China

Received date: 2016-12-16

  Revised date: 2017-01-23

  Online published: 2017-09-20

Supported by

 

摘要

简述磁致伸缩及其参数测量原理,设计了用半导体应变计取代常用的铝丝电阻应变片,研制成新型的半导体微位移传感器,并用标准长度量具对微位移传感器进行定标,从而直接测量出材料在磁场中微小长度变化量. 既解决了原先教学实验不能随意更换样品的麻烦,又提高了测量的灵敏度和精确度,准确测得多种材料的磁致伸缩系数曲线.

本文引用格式

倪敏 , 张一帆 , 郑源明 , 董琳 , 赵彩安 . 用半导体微位移传感器测量磁致伸缩系数[J]. 大学物理, 2017 , 36(9) : 35 -37 . DOI: 10. 16854 /j. cnki. 1000-0712. 2017. 09. 010

Abstract

Magnetostrictive measurement principle and the parameters are outlined,which is designed to replace commonly used semiconductor strain gauges of aluminum wire resistance strain gauges,the development of a new type of semiconductor micro - displacement sensor,and measuring the standard length of the micro - displacement sensor calibration. It can be used to measure directly a small length of the material in a magnetic field variation.  Which addresses the teaching experiment that could not easily replace the original samples of the trouble,but also improves the measurement sensitivity and accuracy,a variety of materials accurately measured the magnetostriction coefficient curve.

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