本文提出了一种绝缘性能失效温度的测试方法. 将待测绝缘材料制作为平行板电容器，通过测量交流阻抗频率谱，利用阻抗频率谱中相关物理量的特征信息，对绝缘性能的失效温度、绝缘性能保持温度上限、耐热等级等参数进行了定量评价.

In this paper a method to characterize the performance failure temperatures of insulating materials is proposed. By measuring the AC impedance frequency spectrum of the parallel plate capacitor based on the tested insulating material, the relevant properties of the failure temperature of insulation performance, the upper limit of insulation performance holding temperature, heat resistance grade, and other parameters are quantitatively evaluated.