光的干涉和衍射现象是波动光学的重要内容.研究这一现象不仅可以加深对光的波动性的理解，同时还有助于进一步学习近代光学实验技术，如光谱分析、晶体结构分析、全息照相、光信息处理等.本文利用CCD线阵探测器(东芝TCD1304)作为一维光强分布探测器，并自行开发了相应电路和软件，对各种单缝、双缝进行了光强相对分布测量，结果明显地展现出干涉、衍射的特征，并实时给出位置与光强的关系曲线.装置具有结构简单,位置分辨率高达0.01 mm,光强灵敏度范围可同时测得8级以上单缝衍射条纹,实验结果与理论值相对误差小于5%,动态数据刷新率达30 ms/帧.

The interference and diffraction phenomena of light are important contents of wave optics. Studying this phenomenon not only deepens the understanding of the wave nature of light, but also helps to further learn modern optical experimental techniques, such as spectral analysis, crystal structure analysis, holography, optical information processing, etc. In this article, a CCD linear array detector (Toshiba TCD1304) I used as one-dimensional light intensity distribution detector and corresponding circuits and software is developed. The relative distribution of light intensity is measured for various single and double slits. The results clearly show the characteristics of interference and diffraction. The relationship curve between position and light intensity is given in real-time. The apparatus has the superior characteristics of simple structure, high position resolution of 0.01 mm, sensitivity range of light intensity that can simultaneously measure single slit diffraction fringes of more than 8 levels, relative error between experimental results and theoretical values less than 5%, and dynamic data refresh rate of 30 ms/frame.