建立了基于谱域干涉的折射率测量方法及实验系统，系统主要包括光纤迈克耳孙干涉仪、光谱仪、线性拟合及相位去包裹方法. 由光谱仪采集干涉信号，用线性拟合及相位去包裹得到高精度光程，进而计算折射率. 用本系统测得晶圆、N-BK玻璃和蒸馏水的折射率分别为3.511±0.012、1.508±0.019、1.311±0.022，相对误差分别为0.23%、0.33%、0.37%. 该方法可以对透明及半透明的固体及液体样品进行折射率测量，不需要对样品进行特殊处理，本系统体现了干涉技术的新发展及应用.

A refractive index measurement method and an experimental system based on spectral domain interference have been established, which mainly includes a fiber-optic Michelson interferometer, a spectrometer, linear fitting and phase unwrapping methods. Interference signals are collected by the spectrometer, and high-precision optical path lengths are obtained using linear fitting and phase unwrapping methods, thereby calculating the refractive index. Using this system, the refractive indices of silicon wafers, N-BK7 glass, and distilled water are measured to be 3.511±0.012, 1.508±0.019, and 1.311±0.022, respectively. The relative errors are 0.23%, 0.33%, and 0.37%, respectively. This method enables refractive index measurements of transparent and translucent solid and liquid samples without the need for special sample treatment, showing a new development and application of interferometry technology.