针对半导体材料霍尔系数、塞贝克系数和电阻率三个重要物理量无法在同一台设备、同一个样品完成测试的现状，本文将范德堡法测试霍尔系数和电阻率与准稳态法测试塞贝克系数集成在一起，设计了半导体材料从室温至573 K温度范围内的霍尔、塞贝克系数和电阻综合测量实验平台.在此基础上，以N型InSb和P型MnTe两种典型半导体材料的霍尔系数、电导率和塞贝克系数测量为教学内容开展了实验教学，有效提高了学生对固体物理基础知识的理解和运用，实现了理论教学与实验教学的有机结合.

Since the Hall coefficient, Seebeck coefficient, and resistivity of semiconductor materials cannot be tested on the same device and sample, we integrate the Vanderberg method for Hall coefficient and resistivity testing with the quasi-steady-state method for Seebeck coefficient testing, successfully designe an experimental equipment for Hall coefficient, Seebeck coefficient, and resistance measurement of semiconductor materials in the temperature range of room temperature to 573 K. Then, two typical semiconductor materials, including N-type InSb and P-type MnTe, are measured using this equipment as experimental teaching content. This experimental teaching effectively improves the understanding and application of solid state physics’ knowledge of students, thus achieving the organic combination of theoretical teaching and experimental teaching.