用表面磁光克尔原理测量薄膜材料的磁性参数

›› 2009, Vol. 28 ›› Issue (9): 36-36.

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Measurement of film＇s magnetic parameters based on the principle of surface magneto-optic Kerr effect

Online:2009-09-20 Published:2009-09-20

Abstract

CLC Number:

O441.6

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Measurement of film＇s magnetic parameters based on the principle of surface magneto-optic Kerr effect

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