Design and verification of a contactless micrometer

  

  • LI Meng-zhao ,
  • XIE Jie ,
  • CHANG Xiang-hui ,
  • LIU Qi-jun ,
  • FAN Dai-he
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  • School of Physical Science and Technology,Southwest Jiaotong University,Chengdu,Sichuan 611756,China

Received date: 2017-02-21

  Revised date: 2017-04-16

  Online published: 2017-12-20

Abstract

By using the spectrometer,linear CCD and other commonly used laboratory devices,a method is designedthat the thickness and refractive index of the glass can be measured simultaneously and contactless. The method is verified by the uncertainty analysis that,it has the property of high accuracy that can equal to micrometer.Furthermore,the thickness and the refractive index of a real glass have been measured. The results have shown the feasibility of the method.

Cite this article

LI Meng-zhao , XIE Jie , CHANG Xiang-hui , LIU Qi-jun , FAN Dai-he . Design and verification of a contactless micrometer

  
[J]. College Physics, 2017 , 36(12) : 57 -61 . DOI: 10.16854/j.cnki.1000-0712.2017.12.015

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