Multi-technical integration experiment for measuring the young’ s modulus of metal wires: improvements and precision enhancement
Received date: 2025-01-16
Revised date: 2025-01-31
Online published: 2025-12-26
Key words: youngs modulus; optic wedge interference; data accuracy
HUANG Shuqi, LI Yuke . Multi-technical integration experiment for measuring the young’ s modulus of metal wires: improvements and precision enhancement[J]. College Physics, 2025 , 44(10) : 96 . DOI: 10.16854 /j.cnki.1000-0712.250026
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