大学物理 ›› 2024, Vol. 43 ›› Issue (8): 68-.doi: 10.16854/j.cnki.1000-0712.230274

• 大学生园地 • 上一篇    下一篇

半波带法计算夫琅禾费单缝衍射各级明纹中心相对光强

王致远,范玲   

  1. 1. 北京交通大学 詹天佑学院,北京  100044;2. 北京交通大学 物理科学与工程学院,北京100044
  • 收稿日期:2023-07-26 修回日期:2023-12-27 出版日期:2024-09-01 发布日期:2024-09-18
  • 作者简介:王致远(2003—),男,湖南株洲人,北京交通大学詹天佑学院2021级本科生

Calculation of relative light intensity of centers of bright stripes in  Fraunhofer single slit diffraction by half-wave zone method

WANG Zhi-yuan, FAN Ling   

  1. 1. Jeme TienYow Honors College,Beijing Jiaotong University,Beijing 100044,China;
    2. School of Physical Science and Engineering,Beijing Jiaotong University,Beijing 100044,China
  • Received:2023-07-26 Revised:2023-12-27 Online:2024-09-01 Published:2024-09-18

摘要: 本文给出了一种直接求解夫琅禾费单缝衍射各级明纹中心相对光强的近似方法,并进行了深入的误差分析. 将半波带法和振幅矢量法相结合,简洁直观地得到了各级明纹中心相对光强. 通过振幅矢量图形的对比,分析了误差原因,通过公式推导和定量计算得出了各级明纹中心精确位置的限制条件. 对误差的变化进行了分析,发现本方法相对误差最大值小于5 %,且级数大于或等于3时,相对误差均小于1%.

关键词: 夫琅禾费单缝衍射, 半波带法, 相对光强, 误差分析

Abstract: An approximation method for directly solving the relative light intensity of centers of bright stripes in Fraunhofer single slit diffraction is presented,and an in-depth error analysis is conducted. By combining half-wave zone method and amplitude vector method,the central light intensity of bright stripes can be calculated simply and directly. By comparing different amplitude vector graphics,the error cause is analyzed. The accurate positions of bright center are obtained through quantitative analysis. It is found that the maximum relative error of this method is less than 5 %,and when the fringe order is greater than or equal to 3,the relative error is less than 1%.

Key words: Fraunhofer single slit diffraction, half-wave zone method, relative light intensity, error analysis