大学物理 ›› 2019, Vol. 38 ›› Issue (4): 63-69.doi: 10.16854 /j.cnki.1000-0712.180475

• 大学生园地 • 上一篇    下一篇

NaI( Tl) 谱仪中反散射峰的影响因素研究

李根,魏凡,楼建玲   

  1. 北京大学物理学院核物理与核技术教学实验室,北京100871
  • 收稿日期:2018-08-08 修回日期:2018-11-03 出版日期:2019-04-20 发布日期:2019-05-10
  • 通讯作者: 楼建玲,E-mail: jllou@ pku.edu.cn
  • 作者简介:李根( 1996—) ,男,湖南湘潭人,北京大学物理学院2014 级本科生.
  • 基金资助:
    国家自然科学基金( 11775004) ; 理科基地( J1103206) 资助

Study of influence factors of backscattering peak in NaI ( Tl) spectrometer with Geant4

LI Gen,WEI Fan,LOU Jian-ling   

  1. Teaching Laboratory of Nuclear Physics and Nuclear Technology,School of Physics,Peking University,Beijing 100871,China
  • Received:2018-08-08 Revised:2018-11-03 Online:2019-04-20 Published:2019-05-10

摘要: 本文利用Geant4 和分离变量的方法,模拟了衬底材料、以及闪烁体的包装材料对反散射峰计数大小的影响. 使用不

同衬底材料时,模拟产生的反散射峰与全能峰计数比例、不同材料的饱和厚度值,与实验结果一致. 本文还模拟了反散射峰计

数随着闪烁体包装材料的厚度,以及闪烁体的长度、横截面积和体积的变化关系,找到了抑制由此产生反散射峰本底的方法.

关键词: 康普顿散射, 反散射峰, 饱和厚度, Geant4

Abstract: The influences of substrate material and packaging material of scintillator on the backscattering peak

counts are simulated by the Code of Geant4 and the variable separation method. When using different substrate materials,

the ratio between the backscattering peak and full-energy peak counts,as well as the simulated saturation

thicknesses of different materials are in agreement with the experimental results. The backscattering peak counts as

functions of the thickness of scintillator packaging material,as well as the length,the cross-sectional area and the

volume of scintillator are also simulated,and the method to suppress the backscattering peak background is found.

Key words: Compton scattering, backscattering peak, solid angle, saturation thickness, Geant4