大学物理 ›› 2009, Vol. 28 ›› Issue (4): 52-52.

• 著者文摘 • 上一篇    下一篇

分光仪调整中干涉现象的分析与应用

刘金[1] 李朝荣[2] 汪世英[3] 张一波[4]   

  1. [1]北京航空航天大学电子信息工程学院,北京100191 [2]北京航空航天大学理学院,北京100191 [3]北京大学物理学院,北京100871 [4]北京航空航天大学航空科学和工程学院,北京100191
  • 出版日期:2009-04-20 发布日期:2009-04-20

Analysis and application of the interference phenomenon in spectrometer adjustment

  • Online:2009-04-20 Published:2009-04-20

摘要: 描述了在分光仪调整实验中观察到的干涉条纹现象,并且当转动平行平板玻璃时,该干涉条纹有粗细疏密变化.本文从理论上分析了产生干涉条纹及干涉条纹疏密粗细变化的原因.在已知平行平板玻璃的厚度和光的波长的情况下,可应用该现象测量平行平板玻璃折射率,给出了折射率的计算方法,对结果进行了数据处理及误差分析.

关键词: 分光仪, 干涉条纹, 粗细疏密变化, 折射率

Abstract: An interference phenomenon in the experiment of adjusting spectrometer is discussed mainly. When turning the glass used in the experiment to adjust the verticality between the axis of telescope and the axis of the apparatus, an interference phenomenon together with variation in width of the stripe can be seen. The reason of the phenomenon and variation of the stripe in theory are analyzed. If one knows how thick the reflector is and the wavelength of the light used in the lab in advance, one can use this phenomenon to measure the refractive index of the glass. The calculating method, data processing and error analyzing are also shown.

Key words: spectrometer, interference stripe, thickness and density changes of the stripe, refractive index

中图分类号: 

  • O436.1