Abstract: The interference and diffraction phenomena of light are important contents of wave optics. Studying this phenomenon not only deepens the understanding of the wave nature of light, but also helps to further learn modern optical experimental techniques, such as spectral analysis, crystal structure analysis, holography, optical information processing, etc. In this article, a CCD linear array detector (Toshiba TCD1304) I used as one-dimensional light intensity distribution detector and corresponding circuits and software is developed. The relative distribution of light intensity is measured for various single and double slits. The results clearly show the characteristics of interference and diffraction. The relationship curve between position and light intensity is given in real-time. The apparatus has the superior characteristics of simple structure, high position resolution of 0.01 mm, sensitivity range of light intensity that can simultaneously measure single slit diffraction fringes of more than 8 levels, relative error between experimental results and theoretical values less than 5%, and dynamic data refresh rate of 30 ms/frame.

Key words: interference of light, diffraction of light, CCD linear array detector, one-dimensional light intensity distribution