›› 2006, Vol. 25 ›› Issue (5): 34-34.

• 著者文摘 • Previous Articles     Next Articles

An analysis of factors that impact maximum self-induced EMF in open RL circuit

  

  • Online:2006-05-25 Published:2006-05-20

Abstract: A theoretical analysis is presented for the factors influencing maximum self-induced EMF in transient process in RL circuit. Then it is verified experimentally by various apparatus and scheme.

Key words: RL circuit, self-induced EMF, maximum, analyze and verify

CLC Number: 

  • O4-33