›› 2006, Vol. 25 ›› Issue (5): 34-34.
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Abstract: A theoretical analysis is presented for the factors influencing maximum self-induced EMF in transient process in RL circuit. Then it is verified experimentally by various apparatus and scheme.
Key words: RL circuit, self-induced EMF, maximum, analyze and verify
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https://dxwl.bnu.edu.cn/EN/Y2006/V25/I5/34
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