The experimental device for measuring the thickness of the optical elements based on the Michelson interferometer
ZHOU Jinxin1,WANG Yunxin2,ZHANG Xin2
1. Electronic Technology Department,Tianjin Electronic Information Vocational Technology College,Tianjin 300350,China; 2. College of Applied Sciences,Beijing University of Technology,Beijing100124,China
ZHOU Jinxin,WANG Yunxin,ZHANG Xin. The experimental device for measuring the thickness of the optical elements based on the Michelson interferometer[J].College Physics, 2016, 35(5): 24-26.