College Physics ›› 2016, Vol. 35 ›› Issue (5): 24-26.

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The experimental device for measuring the thickness of the optical elements based on the Michelson interferometer

ZHOU Jinxin1,WANG Yunxin2,ZHANG Xin2   

  1. 1. Electronic Technology Department,Tianjin Electronic Information Vocational Technology College,Tianjin 300350,China; 2. College of Applied Sciences,Beijing University of Technology,Beijing100124,China
  • Received:2015-04-21 Revised:2015-10-19 Online:2016-05-20 Published:2016-05-20

Abstract: An experimental apparatus is described,which can be used to measure the depth of optical elements based on the Michelson interferometer. Firstly,the basic theory of a Michelson interferometer is analyzed. Secondly,a Michelson interferometer optical setup is built to measure the depth of the glass slide,it used CCD and computerto capture and observe interference fringes,and MATLAB software is applied for image processing. Finally,the factors affecting the measurement accuracy is given. Experimental results show that it can be more accurate and convenient which use the Michelson interferometer to measure element thickness with the help of MATLAB software.

Key words: Faraday effect, Jones matrix, rotation, ellipticity