College Physics ›› 2019, Vol. 38 ›› Issue (6): 60-.doi: 10.16854 /j.cnki.1000-0712.180549
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LIU Xin-meng1,WANG Hao1,WANG Yi1,YE Shi-li2,XU Rui2,CHENG Zhi-hai1
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Abstract: In this study,MFM is used to scan and observe the surface and magnetization of FePt nanowires scattered
on a SiO2 substrate and their magnetic images are also obtained. The magnetizaion distribution of FePt nanowires
is analyzed based on bright and dark regions shown on magnetic images. The aggregation of nanowires with opposite
magnetization indicates magnetic materials always tend to be in the lowest energy state. The orientation of magnetization
of FePt nanowires can be controlled and magnetic reversal is observed by applying external magnetic field.
Key words: atomic force microscope, magnetic force microscope, FePt nanowires, magnetic reversal
LIU Xin-meng, WANG Hao, WANG Yi, YE Shi-li, XU Rui, CHENG Zhi-hai. A magnetic force microscopy study of FePt nanowires[J].College Physics, 2019, 38(6): 60-.
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URL: https://dxwl.bnu.edu.cn/EN/10.16854 /j.cnki.1000-0712.180549
https://dxwl.bnu.edu.cn/EN/Y2019/V38/I6/60
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