›› 2011, Vol. 30 ›› Issue (7): 51-51.

• 著者文摘 • Previous Articles     Next Articles

A simulation platform for amplitude modulation atomic force microscope

  

  • Online:2011-07-25 Published:2011-07-20

Abstract: The model of amplitude modulation atomic force microscope(AM-AFM) probe dynamic process is obtained by the Euler-Bernoulli equation.Based on AM-AFM's negative feedback control system with a PID controller,a simulation platform for AM-AFM is established.The simulation results show that the platform can accurately reflect the dynamic characteristic when the probe approaches and scans the sample.In consequence,for students doing the AM-AFM experiment,the platform can be used as an effective tool,which helps the students to have a deeper understanding on the AM-AFM,as well as a tentative experience before practice.

Key words: amplitude modulation atomic force microscope, AM-AFM simulation platform, Euler-Bernoulli equation, PID control

CLC Number: 

  • TP391.9