Abstract: A kind of near-field optical experimental device based on Michelson interferometer is introduced. The device can be used for measurement of evanescent field exist in the near-field of prism surface when total internal reflection occur, also it can be used to observe the near-field optical structure of two dimensional grating and experiments of photon scanning tunneling microscope in principle. It is helpful for students to understand the structure of evanescent field and basic principle of scanning near-field optical microscope. The device is simple and easy to operate;also it has the advantage of high reliability, so it is suitable to be applied in physics experiment.

Key words: Michelson interferometer, tota linternal reflection, scanning near-field optical microscope, photon scanning tunneling microscope