大学物理 ›› 2009, Vol. 28 ›› Issue (4): 40-40.
• 著者文摘 • 上一篇 下一篇
李武军 王晓颖
出版日期:
发布日期:
Online:
Published:
摘要： 为了研究塞曼效应分裂谱线的相对强度，分析了Hg（546．1nm）谱线能级在外磁场中的分裂情况，详细给出了分裂能级的量子数分布和理论相对强度；在此基础上采用CCD拍摄了分裂谱线干涉圆环的图像，并对其进行了强度分析，通过图像强度处理得到各分裂谱线相对强度与理论分析结果十分接近；表明采用CCD图像技术能较好的分析塞曼效应现象和规律．
关键词: 塞曼效应, 磁场, CCD图像, 相对强度
Abstract: In order to study the relatively intensity of Zeeman effect split spectrum line, the quantum number distribution and the relatively intensity are presented in detail by the analysis of Hg（546.1 nm）spilt spectrum line in the external magnetic field; the image of coherence circle is obtained by CCD, and the intensity of image is analyzed, the relatively intensity of the spilt spectrum line by image disposed is close to the theoretical result. It is concluded that the phenomenon and rule of Zeeman effect can be analyzed by CCD image technology.
Key words: Zeeman effect, magnetic field, CCD image, relatively intensity
中图分类号:
李武军 王晓颖. 汞原子塞曼效应分裂谱线相对强度的测量[J]. 大学物理, 2009, 28(4): 40-40.
0 / / 推荐
导出引用管理器 EndNote|Reference Manager|ProCite|BibTeX|RefWorks
链接本文: https://dxwl.bnu.edu.cn/CN/
https://dxwl.bnu.edu.cn/CN/Y2009/V28/I4/40
Cited
